Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
Electron Microscopy Sciences TEM Screen Recoating Phillips Small Focusing
For optimum viewing, fluorescent screens should be recoated regularly. Viewing screens are easily damaged by the electron beam, especially at high accelerating voltages where knock-on damage can be severe. A proprietary process where 1 to 2 micron particles of phosphor are deposited on the screen and produce the highest possible resolution.
Electron Microscopy Sciences Chessy Test Specimen
This precise SEM calibration specimen consist of more than 1.6 million gold squares of 1 size on silicon forming a 4-fold checkerboard pattern in an area of 5 mm square. The smallest metric checkerboard has a size of 10 x 10. Such checkerboards form larger metric checkerboards of 100 x 100 - These again form checkerboards of 1 mm square. Finally, such 1mm squares are arranged in the same manner covering a field of 5 mm square.
The edges of the empty corners in 0.1 and 1 mm checkerboards are additionally marked. The surrounding frame is 10 wide and has an outer side length of 5.04 mm. The pattern was directly written by e-beam lithography using the new ZBA 31/32 from JENOPTIK.
Electron Microscopy Sciences Cross Scale Reticle RET 30, 21 mm, 10 mm Scale, 0.10 mm x 100 Divisions
High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.
Size: 21 mm
Scale: 10 mm
Divisions: 0.10 mm x 100
Electron Microscopy Sciences PremaDisk Diamond Grinding Disc SM Medium-Hard Bond, 30 µm Particles, 350 mm diameter
PremaDisk Flexible Diamond Grinding Discs offer superior surface finishes that are usually only seen in lapping processes.
The SM disc is a medium-hard resin bond base for fine grinding and polishing of metals, ceramics and glass.
The SH disc is a hard resin bond base for applications where a very sharp edge must be maintained on the workpiece.
Both discs increase productivity by combining optimum surface quality, removal rates, and tool life in the same process.
Particles: 30 µm
Diameter: 350 mm
Electron Microscopy Sciences Microscope Graticule NE31 Horizontal, 19 mm, 0.5" with 100 divisions of 0.0005"
These scales are used for the measuring of lengths of specimen or distances between points on a variety of different shaped objects. By dividing the division of the chosen graticule by the magnification of the objective one obtains an approximate value that each division will represent on the stage. Horizontal micrometer scale.
Size: 19 mm
Electron Microscopy Sciences Gilder Finder Grid HF3, 200 mesh Nickel Grid
Used to identify specific areas of mesh by an alphabetical or numerical code built into the mesh. 3.05 mm diameter, 0.7 mil (18 um) thickness. G200HF3 has 322 grids squares and each can be identified by reference to its unique combination of base 2 binary number and alphabet symbol (A-T).
Grid: Nickel
Pitch: 125 µm
Electron Microscopy Sciences British Standard Graticle NG10, 21mm
In this graticule the circle areas double progressively, hence the diameters alter by Root 2, so that the size classes can form a continuation of the standard series of sieves for particle sizing. Each particle is assigned to a size class defined by two adjacent circles, which represent the size limits of that class. Thus the distribution of size is obtained in terms of the diameter of circles having the same projected area as the particles. This method will cover particles in the range 150 micron to 0.38 micron. The size distributions with respect to their number and weight are determined separately. Final results are calculated as cumulative percents.
Originally designed by the National Coal Board for use in coal mining.
Size: 21 mm
Electron Microscopy Sciences Formvar Support Film 5-6 nm thick on Square 100 mesh Gold Grid
Support Film on grids has become a main product line for us since the demand for high quality coated grids has increased. To make your microscopy work easier and to save you a great deal of time we offer you a complete line. All of our coated grids are optically checked followed by batch testing in the EM. Packed in grid storage box. Standard coating is 5 to 6 nm thick.
Grid: Gold
Electron Microscopy Sciences MicroRT™ Room Temperature Crystal Mounting Tubing Kit
MicroRT is the answer for high-throughput room temperature diffraction screening and data collection. Go from crystal in a drop to crystal in the x-ray beam at room temperature in 2 minutes with 99% change of success.
Makes collecting data at room temperature as easy as at low temperatures, and allows you to collect room and low temperature data from the same crystal. Ideal for both room-temperature structure determination and for diagnosing the cause of poor low-temperature diffraction. Each bottle contains 37mm long clear polyester tubes, sealed at one end, an extra-keen razor blade for cutting tubes, and a tiny tube of grease.
Electron Microscopy Sciences Omniprobe Lift-Out Grid 3-Post, Shallow Downset, Cooper
3 post copper lift-out grids specifically designed for in-situ lift-out. These grids include multiple indexed mounting locations with both vertical bar and "V" shaped attachment surfaces. These grids have a shallower downset and slightly wider center post than 75964-01. Packaged in glass vials.
Material: Copper
Hach Company 3/4 Inch Combination pH/ORP Sensor, Convertible Style, Ryton Body Material, General Purpose Glass pH Electrode, No Temperature Compensation, 15 ft Cable
Ryton, Convertible Body Style, 4.5m Analog Cable, General Purpose Glass pH Electrode, No Temperature Compensation
Electron Microscopy Sciences Broken Crosslines Microscope Graticle NE56, 19mm, Broken line
For measurement of large objects in conjunction with a graduated mechanical stage. Measurements in two directions and for sighting and alignment. Broken lines enable fine detail to be seen at the breaks. A thin boundary would be lost behind a a continuous line. Image covers the entire field of view. Surface chrome image.
Size: 19mm
Divisions: Broken line
Electron Microscopy Sciences High Resolution Magnification Calibration Specimen 150-2DUTC for AFM
Model 150-2D is a very high resolution reference and traceable standards for magnification calibration of AFM, SEM, Auger, and FIB. It has a precision, holographic pattern that provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements.
The period is 144 nm pitch, two-dimensional array that is accurate to +/- 1 nm (calibration certificate will have actual pitch.) Surface: Aluminum bumps on Silicon, 4x3 mm die. Bump height (about 90 nm) and width (about 75 nm) are not calibrated.
For SEM an independent analytical lab has tested this specimen in a FE-SEM and found that the pattern was very uniform and the specimen was easy to image. No significant charging was observed in the voltage range 1-20 kV. This traceable, Certified Standard is a select grade.
Electron Microscopy Sciences Standard Pin SEM Stub Slotted 1" head with 1/2" Pin, Aluminum, 3.1 mm Pin diameter
Scanning electron microscope specimen mounts for FEI/Philips, ZEISS/LEO, Cambridge, Leica, Amray, Tescan and Camscan SEMs. Made from lathe finished ultra-pure aluminum.
Head: 1"
Pin height: 1/2"
Pin diameter: 3.1 mm
Electron Microscopy Sciences TEM Screen Recoating JEOL Inner Rectangle
For optimum viewing, fluorescent screens should be recoated regularly. Viewing screens are easily damaged by the electron beam, especially at high accelerating voltages where knock-on damage can be severe. A proprietary process where 1 to 2 micron particles of phosphor are deposited on the screen and produce the highest possible resolution.